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Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping

✍ Scribed by Schülli, T. U.; Stoffel, M.; Hesse, A.; Stangl, J.; Lechner, R. T.; Wintersberger, E.; Sztucki, M.; Metzger, T. H.; Schmidt, O. G.; Bauer, G.


Book ID
121439937
Publisher
The American Physical Society
Year
2005
Tongue
English
Weight
867 KB
Volume
71
Category
Article
ISSN
1098-0121

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