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Structural characterization of the Co[sub 2]FeZ (Z=Al, Si, Ga, and Ge) Heusler compounds by x-ray diffraction and extended x-ray absorption fine structure spectroscopy

✍ Scribed by Balke, Benjamin; Wurmehl, Sabine; Fecher, Gerhard H.; Felser, Claudia; Alves, Maria C. M.; Bernardi, Fabiano; Morais, Jonder

Book ID: 120974748
Publisher: American Institute of Physics
Year: 2007
Tongue: English
Weight: 568 KB
Volume: 90
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2731314

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