✦ LIBER ✦

Structural characterization of interfaces in the AlxGa1−xAs/GaAs/AlxGa1−xAs heterostructures by high-resolution X-ray reflectometry and diffractometry

✍ Scribed by A. A. Lomov; A. G. Sutyrin; D. Yu. Prokhorov; G. B. Galiev; Yu. V. Khabarov; M. A. Chuev; R. M. Imamov

No coin nor oath required. For personal study only.

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