Investigation of SR method grown 〈0 0 1〉 directed KDP single crystal and its characterization by high-resolution X-ray diffractometry (HRXRD), laser damage threshold, dielectric, thermal analysis, optical and hardness studies

✍ Scribed by S. Balamurugan; P. Ramasamy; S.K. Sharma; Yutthapong Inkong; Prapun Manyum

• Book ID: 113783265
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 864 KB
• Volume: 117
• Category: Article
• ISSN: 0254-0584
• DOI: 10.1016/j.matchemphys.2009.06.021