Measurement of aluminum concentration in epitaxial layers of AlxGa1−xAs on GaAs by double axis x-ray diffractometry

✍ Scribed by Tanner, B. K.; Turnbull, A. G.; Stanley, C. R.; Kean, A. H.; McElhinney, M.

• Book ID: 121347120
• Publisher: American Institute of Physics
• Year: 1991
• Tongue: English
• Weight: 664 KB
• Volume: 59
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.106041