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Structural and Morphological Investigation of Pendeo-Epitaxy 3C-SiC on Si Substrates

✍ Scribed by Byeung C. Kim; Michael A. Capano

Book ID: 107455031
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 285 KB
Volume: 37
Category: Article
ISSN: 0361-5235
DOI: 10.1007/s11664-007-0294-2

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