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Structural and mechanical properties of CNx thin films prepared by magnetron sputtering

✍ Scribed by Kurt, R.; Sanjines, R.; Karimi, A.; Lévy, F.


Book ID
122829646
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
340 KB
Volume
9
Category
Article
ISSN
0925-9635

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Thin films of ZrO 2 were prepared by reactive magnetron sputtering. Annealing of the films exhibited a drastic change in the properties due to improved crystallinity and packing density. The root mean square roughness of the sample observed from atomic force microscope is about 5.75 nm which is comp