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Structural and electrical characterizations of n-type implanted layers and ohmic contacts on 3C-SiC

✍ Scribed by X. Song; J. Biscarrat; J.-F. Michaud; F. Cayrel; M. Zielinski; T. Chassagne; M. Portail; E. Collard; D. Alquier


Book ID
108225883
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
702 KB
Volume
269
Category
Article
ISSN
0168-583X

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