Characterization of AuGeNi ohmic contacts on n-GaAs using electrical measurements, Auger electron spectroscopy and X-ray diffractometry

✍ Scribed by J.B.B Oliveira; C.A Olivieri; J.C Galzerani; A.A Pasa; L.P Cardoso; F.C de Prince

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 344 KB
• Volume: 41
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(90)93790-p