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Interface metallization and electrical characterization of Ta–Pt multilayers on n-type SiC

✍ Scribed by H. Yang; T.H. Peng; W.J. Wang; W.Y. Wang; X.L. Chen

Book ID
108063761
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
942 KB
Volume
255
Category
Article
ISSN
0169-4332

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