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Stress transmission in silica particulate epoxy composite by X-ray diffraction

✍ Scribed by Ai-Ru Xu; Takashi Nishino; Katsuhiko Nakamae


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
575 KB
Volume
33
Category
Article
ISSN
0032-3861

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Residual stress in particulate epoxy res
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Residual stress in particulate epoxy resin was investigated by X-ray diffraction. Microdeformation of incorporated A1 and a-Si02 crystal, which was induced by the residual stress, could be detected as a shift of X-ray diffraction peak. The residual stress at the interface between the adherend and th

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Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th