Residual stress in epoxy resin cured on A1 plate was investigated by X-ray diffraction. Microdeformation of A1 crystal can be detected as a shift of X-ray diffraction peak induced by the stress resided. Results show that A1 plate is subjected to a uniaxial compressive stress of 29 MPa parallel to th
Structural and residual stress analysis by X-ray diffraction on polymeric materials and composites
β Scribed by V. Hauk
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 264 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0933-5137
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