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Stress and Structural Images of Microindented Silicon by Raman Microscopy

✍ Scribed by Bowden, Michael; Gardiner, Derek J.

Book ID: 115363252
Publisher: Society for Applied Spectroscopy
Year: 1997
Tongue: English
Weight: 813 KB
Volume: 51
Category: Article
ISSN: 0003-7028
DOI: 10.1366/0003702971942123

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