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Investigation of nanostructured porous silicon by Raman spectroscopy and atomic force microscopy

✍ Scribed by P.G. Abramof; N.G. Ferreira; A.F. Beloto; A.Y. Ueta


Book ID
116667684
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
366 KB
Volume
338-340
Category
Article
ISSN
0022-3093

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