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Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy

✍ Scribed by M. Szybowicz; J. Makowiecki

Publisher: Springer
Year: 2011
Tongue: English
Weight: 769 KB
Volume: 47
Category: Article
ISSN: 0022-2461
DOI: 10.1007/s10853-011-5940-7

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