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Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs

✍ Scribed by M Fadlallah; G Ghibaudo; J Jomaah; M Zoaeter; G Guegan

Book ID: 108361881
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 393 KB
Volume: 42
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(01)00232-3

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