Impact of forward and reverse deep n-well biasing on the 1/f noise of 0.13 μm n-channel MOSFETs in triple well technology

✍ Scribed by Lih Chieh Png; Kok Wai Chew; Kiat Seng Yeo

• Book ID: 108271732
• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 687 KB
• Volume: 53
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2009.03.026