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Static and low-frequency noise characterization in submicron MOSFETs for memories cells applications

✍ Scribed by Na. Sghaier; M. Trabelsi; Ne. Sghaier; L. Militaru; A. Souifi; A. Kalboussi; N. Yacoubi

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 207 KB
Volume: 37
Category: Article
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2006.06.015

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