✦ LIBER ✦
Low-frequency noise as a tool for characterization of nearband impurities in silicon : F. J. Scholz and J. W. Roach. Solid-St. Electron. 35, 447 (1992)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 135 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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