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Sputtering of silicon and gallium arsenide with medium energy intense ion beams of argon and xenon

โœ Scribed by K. Pearmain; B.A. Unvala


Book ID
118367589
Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
490 KB
Volume
25
Category
Article
ISSN
0042-207X

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Sputtering yield of chromium by argon an
โœ A. K. Handoo; P. K. Ray ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Springer ๐ŸŒ English โš– 286 KB

A radioactive tracer technique is described for the quantitative measurement of the sputtering yield of a target material electroplated on a copper substrate. Sputtering yields of chromium by argon and xenon ions with energies from 50 to 500eV are reported. The ion beams, having a current density ra