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Energy and fluence dependence of the sputtering yield of silicon bombarded with argon and xenon. (USA.)


Publisher
Elsevier Science
Year
1980
Tongue
English
Weight
167 KB
Volume
30
Category
Article
ISSN
0042-207X

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Models of Energy Dependence of the Secon
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The energy dependence of secondary ion yield is determined both by the (Sigmund-Thompson or Boltzmann type) energy distribution function of the secondary (neutral) particles and by the (exponential or power law) ionization probability. The combination of these functions results in four possible math