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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Transmission sphere calibration and its current limits

✍ Scribed by Yang, Pengqian; Xu, Jia; Zhu, Jianqiang; Hippler, Stefan; Lehmann, Peter H.; Osten, Wolfgang; Gastinger, Kay

No coin nor oath required. For personal study only.

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