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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Positioning of scanned part inside of the laser triangulation system

✍ Scribed by Stankiewicz, M.; Reiner, J.; Kotnarowski, G.; Lehmann, Peter H.; Osten, Wolfgang; Gastinger, Kay

No coin nor oath required. For personal study only.

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