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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filters

✍ Scribed by Fadeyev, A. V.; Pozhar, V. E.; Lehmann, Peter H.; Osten, Wolfgang; Gastinger, Kay

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