SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Low coherence full field interference microscopy or optical coherence tomography: recent advances, limitations and future trends

✍ Scribed by Abdulhalim, I.; Lehmann, Peter H.; Osten, Wolfgang; Albertazzi, Armando

• Book ID: 120395488
• Publisher: SPIE
• Year: 2013
• Weight: 512 KB
• Volume: 8788
• Category: Article
• DOI: 10.1117/12.2025199