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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Dimensional Optical Metrology and Inspection for Practical Applications II - Spatial fringe analysis based on FFT using only two speckle pattern in ESPI

✍ Scribed by Arai, Yasuhiko; Harding, Kevin G.; Huang, Peisen S.; Yoshizawa, Toru

Book ID: 121436489
Publisher: SPIE
Year: 2013
Weight: 454 KB
Volume: 8839
Category: Article
DOI: 10.1117/12.2027774

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