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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Practical absolute optical surface metrology and novel applications in adaptive optics

✍ Scribed by Bloemhof, E. E.; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

No coin nor oath required. For personal study only.

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