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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Calculating BTDF from window surface roughness

✍ Scribed by Stover, John C.; Lopushenko, Vladimir; Tayabaly, Kashmira; Church, Eugene; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

Book ID
121488512
Publisher
SPIE
Year
2013
Weight
320 KB
Volume
8838
Category
Article

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