SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Incorporating skew into RMS surface roughness probability distributions

✍ Scribed by Stahl, Mark T.; Stahl, H. Philip; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

• Book ID: 121488514
• Publisher: SPIE
• Year: 2013
• Weight: 772 KB
• Volume: 8838
• Category: Article
• DOI: 10.1117/12.2024883