SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical Manufacturing and Testing X - Metrology measurements for large-aperture VPH gratings

✍ Scribed by Zheng, Jessica R.; Gers, Luke; Heijmans, Jeroen; Fähnle, Oliver W.; Williamson, Ray; Kim, Dae Wook

• Book ID: 121488510
• Publisher: SPIE
• Year: 2013
• Weight: 443 KB
• Volume: 8838
• Category: Article
• DOI: 10.1117/12.2024493