SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Infrared Sensors, Devices, and Applications III - Imaging resolution analysis using Fourier-Slice theorem in reflective tomography laser radar

✍ Scribed by Yan, Yi; Jin, Xiaofeng; Zhou, Shuping; Sun, Jianfeng; Liu, Liren; LeVan, Paul D.; Sood, Ashok K.; Wijewarnasuriya, Priyalal S.; D'Souza, Arvind I.

• Book ID: 121386395
• Publisher: SPIE
• Year: 2013
• Weight: 836 KB
• Volume: 8868
• Category: Article
• DOI: 10.1117/12.2023544