SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical System Alignment, Tolerancing, and Verification VII - Highly accurate measurement of lens surface distances within optical assemblies for quality testing

✍ Scribed by Langehanenberg, P.; Ruprecht, A.; Off, D.; Lueerss, B.; Sasián, José; Youngworth, Richard N.

• Book ID: 121320366
• Publisher: SPIE
• Year: 2013
• Weight: 603 KB
• Volume: 8844
• Category: Article
• DOI: 10.1117/12.2024157