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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optical System Alignment, Tolerancing, and Verification VII - Secondary color correction and tolerance sensitivity: What can you get away with?

✍ Scribed by Rogers, John R.; Sasián, José; Youngworth, Richard N.

Book ID: 121209898
Publisher: SPIE
Year: 2013
Weight: 739 KB
Volume: 8844
Category: Article
DOI: 10.1117/12.2024542

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