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SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Advances in Resist Technology and Processing XXIII - Reactive ion etching of fluorine containing photoresist

โœ Scribed by Patel, Kaushal S.; Pham, Victor; Li, Wenjie; Khojasteh, Mahmoud; Varanasi, Pushkara Rao; Lin, Qinghuang


Book ID
120764403
Publisher
SPIE
Year
2006
Weight
256 KB
Volume
6153
Category
Article

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