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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Photoacoustic spectroscopy of semiconductor nanoclusters incorporated into various dielectric matrices

✍ Scribed by Blonskij, Ivan V.; Tkhoryk, Volodymyr A.; Tel'biz, German M.; Turchack, Roman V.; Salnikov, Vadim O.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

Book ID: 120816581
Publisher: SPIE
Year: 1998
Weight: 723 KB
Volume: 3359
Category: Article
DOI: 10.1117/12.306251

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