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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Characterization of layered structures by photoacoustic piezoelectric technique

✍ Scribed by Shendeleva, Margarita L.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

Book ID: 111961091
Publisher: SPIE
Year: 1998
Weight: 326 KB
Volume: 3359
Category: Article
DOI: 10.1117/12.306266

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