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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Cryogenic spectrometric ellipsometer for studying solid state optical properties

✍ Scribed by Belyaeva, Alla I.; Grebennik, T. G.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

Book ID: 120663426
Publisher: SPIE
Year: 1998
Weight: 259 KB
Volume: 3359
Category: Article
DOI: 10.1117/12.306252

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