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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Tuesday 13 May 1997)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997 - Laser damage threshold and microfaultness of large KDP crystals

✍ Scribed by Salo, Vitaly I.; Tkachenko, V. F.; Rom, M. A.; Puzikov, Viacheslav M.; Kolybayeva, Marina I.; Svechnikov, Sergey V.; Valakh, Mikhail Y.

Book ID: 118254063
Publisher: SPIE
Year: 1998
Weight: 803 KB
Volume: 3359
Category: Article
DOI: 10.1117/12.306277

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