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SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Laser-thermal diagnostics of multilayer opto- and microelectronic structures

✍ Scribed by Svechnikov, Sergey V.; Fedorenko, Leonid L.; Kaganovich, E. B.; Plahkotny, V. P.; Baranetz, S. V.; Antonov, V. A.; Svechnikov, Sergei V.; Valakh, Mikhail Y.

Book ID: 121335978
Publisher: SPIE
Year: 1994
Weight: 533 KB
Volume: 2113
Category: Article
DOI: 10.1117/12.191987

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