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SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Express method for optical strength diagnostics in transparent dielectrics and semiconductors

✍ Scribed by Korsunskaya, Nadezhda E.; Kulish, Nicolai R.; Pekar, Grigory S.; Singaevsky, Aleksandr F.; Svechnikov, Sergei V.; Valakh, Mikhail Y.

Book ID: 121410926
Publisher: SPIE
Year: 1994
Weight: 370 KB
Volume: 2113
Category: Article
DOI: 10.1117/12.191984

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