✦ LIBER ✦

SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Three-dimensional reconstruction for high-speed volume measurement

✍ Scribed by Lee, Dah-Jye; Lane, Robert M.; Chang, Guang-Hwa; Harding, Kevin G.; Miller, John W. V.; Batchelor, Bruce G.

No coin nor oath required. For personal study only.

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