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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Three-dimensional reconstruction for high-speed volume measurement

โœ Scribed by Lee, Dah-Jye; Lane, Robert M.; Chang, Guang-Hwa; Harding, Kevin G.; Miller, John W. V.; Batchelor, Bruce G.


Book ID
118018951
Publisher
SPIE
Year
2001
Weight
207 KB
Volume
4189
Category
Article

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