SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Two- and Three-Dimensional Methods for Inspection and Metrology III - Hausdorff distance based PCB inspection system with defect classification

✍ Scribed by Chen, Chun-Jen; Lai, Shang-Hong; Lee, Win-How; Lin, Chun-Yu; Ku, Terry; Chen, Chiu-Hui; Chung, Yueh-Ching; Harding, Kevin G.

• Book ID: 111672105
• Publisher: SPIE
• Year: 2005
• Weight: 322 KB
• Volume: 6000
• Category: Article
• DOI: 10.1117/12.639586