SPIE Proceedings [SPIE Photonics East '96 - Boston, MA (Monday 18 November 1996)] Three-Dimensional Imaging and Laser-Based Systems for Metrology and Inspection II - Comparison of surface contour measurements based on speckle pattern sampling and coordinate measuring machines

✍ Scribed by Hallerman, Gregory R.; Shirley, Lyle G.; Harding, Kevin G.; Svetkoff, Donald J.

• Book ID: 121346783
• Publisher: SPIE
• Year: 1997
• Weight: 688 KB
• Volume: 2909
• Category: Article
• DOI: 10.1117/12.263314