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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Laser range-finding by phase-shift measurement: moving toward smart systems

โœ Scribed by Poujouly, Stephane; Journet, Bernard A.; Harding, Kevin G.; Miller, John W. V.; Batchelor, Bruce G.


Book ID
121213405
Publisher
SPIE
Year
2001
Weight
91 KB
Volume
4189
Category
Article

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