SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - Laser range-finding by phase-shift measurement: moving toward smart systems

✍ Scribed by Poujouly, Stephane; Journet, Bernard A.; Harding, Kevin G.; Miller, John W. V.; Batchelor, Bruce G.

• Book ID: 121213405
• Publisher: SPIE
• Year: 2001
• Weight: 91 KB
• Volume: 4189
• Category: Article
• DOI: 10.1117/12.417192