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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Determination of the optical constants of thin films by means of transmission spectra and curve fitting

✍ Scribed by Jia, Hongzhi; Lu, Huancai; Peng, Jianhua; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120295333
Publisher
SPIE
Year
2010
Weight
414 KB
Volume
7656
Category
Article

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