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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Multi-camera calibration based on openCV and multi-view registration

✍ Scribed by Deng, Xiao-ming; Wan, Xiong; Zhang, Zhi-min; Leng, Bi-yan; Lou, Ning-ning; He, Shuai; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120179284
Publisher
SPIE
Year
2010
Weight
527 KB
Volume
7656
Category
Article

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