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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Auto-measurement system of aerial camera lens' resolution based on orthogonal linear CCD

✍ Scribed by Zhao, Yu-liang; Zhang, Yu-ye; Ding, Hong-yi; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120083983
Publisher
SPIE
Year
2010
Weight
259 KB
Volume
7656
Category
Article

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