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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - CCD non-uniformity effects on position accuracy of star sensor

✍ Scribed by Liao, Jia-li; Liu, Hai-bo; Jia, Hui; Yang, Jian-kun; Tan, Ji-chun; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120175581
Publisher
SPIE
Year
2010
Weight
238 KB
Volume
7656
Category
Article

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