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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Study on high-performance whole spectrum and multi-band antireflective films on ZnS optical windows

✍ Scribed by Zhang, Tao; Chen, Xian-he; Chen, Jun-xia; Liu, Hai-wei; Chen, Ju-yi; Yang, Li; Namba, Yoshiharu; Walker, David D.; Li, Shengyi

Book ID: 120312807
Publisher: SPIE
Year: 2010
Weight: 961 KB
Volume: 7655
Category: Article
DOI: 10.1117/12.866705

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