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Specular X-ray Reflectivity and Small Angle Neutron Scattering for Structure Determination of Ordered Mesoporous Dielectric Films

✍ Scribed by Vogt, Bryan D.; Lee, Hae-Jeong; Wu, Wen-li; Liu, Youfan

Book ID: 127150284
Publisher: American Chemical Society
Year: 2005
Tongue: English
Weight: 470 KB
Volume: 109
Category: Article
ISSN: 0022-3654
DOI: 10.1021/jp0525641

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